- Ana Dal Fen Bilimleri ve Matematik Temel Alanı
- Yan Dal Fizik
Citation impact
Citation counts of the articles matched in OpenAlex, citing publications from Crossref and the Stanford/Elsevier list. Sources are shown separately and never added up.
- i10-index
- 6
- Total citations
- 237 Top 27% in Türkiye
- Per article
- 21.5
- FWCI
- 1.74 1.00 = world average
- World top 1%
- 0
- World top 10%
- 4
Most cited articles
- On the profile of temperature dependent series resistance in Al Si3N4 p Si MIS Schottky diodes
- A compare of electrical characteristics in Al p Si MS and Al C20H12 p Si MPS type diodes using current voltage I V and capacitance voltage C V measurements
- Temperature dependence of characteristic parameters of the Au/C20H12/n-Si Schottky barrier diodes (SBDs) in the wide temperature range
How is this computed?
h-index and citations are computed from the citation counts of this academic’s YÖKSİS articles matched in OpenAlex (not Google Scholar, WoS or Scopus). Unmatched articles are not included. 1 articles (60 citations) tagged with this academic’s YÖK author id in co-authors’ YÖKSİS records count only towards citations, h-index and i10; article counts, percentiles and rankings use their own YÖKSİS list. h-index on the OpenAlex author profile: 11.
Citing publications Crossref 30 publications citing 10 DOI-bearing articles · 22 Türkiye-affiliated
- 2019 8
- 2020 8
- 2021 7
- 2022 1
- 2025 3
- 2026 3
- BODIPY and Aza-BODIPY based Schottky-type photodiodes for optoelectronic applications TR Gökhan Sevinç et al. · Inorganic Chemistry Communications · 2026
- A comparison of the effects of different light intensities on the current-voltage characteristics of the Si3N4 interface with various thicknesses grown on the (Au: Ti)/n-GaAs (MS) structure TR Mahmut Bucurgat et al. · Optical Materials · 2026
- Investigation Of Electrical Characteristics, Voltage-Dependent Interface States, And Series Resistance of Au/AgNiO/n-Si Structures Using Low-High Frequency Capacitances TR Esra Yükseltürk · Journal of the Institute of Science and Technology · 2026 · cites 2 articles of this academic
- Impedance measurement to characterize dielectric response of Au-Si Schottky structure with PVC: cr interfaces TR E. Yükseltürk · Polymer Bulletin · 2025
- DOI 10.1109/ted.2025.3626337 2025
- DOI 10.1007/s10854-025-16166-z 2025
- Temperature Dependent Current Transport Mechanism of Photopolymer Based Al/NOA60/p-Si MPS Device TR Şadan Özden et al. · Journal of Inorganic and Organometallic Polymers and Materials · 2022
- Illumination and voltage effects on the forward and reverse bias current–voltage (I-V) characteristics in In/In2S3/p-Si photodiodes TR Esra Yükseltürk et al. · Journal of Materials Science: Materials in Electronics · 2021
- The investigation of current condition mechanism of Al/Y2O3/p-Si Schottky barrier diodes in wide range temperature and illuminate TR Ömer Sevgili et al. · Microelectronics Reliability · 2021
- The investigation of the electrical characteristics and photo-response properties of the Al/(CMAT)/p-Si structures TR Omer Sevgi̇li̇ · Solid State Sciences · 2021
- Effect of illumination on the electrical characteristics of Au/n-GaP/Al and Au/Chlorophyll-a/n-GaP/Al structures TR Fikriye Şeyma Kaya et al. · Materials Science and Engineering: B · 2021
- Interpretation of the I–V, C–V and G/ω-V characteristics of the Au/ZnS/n-GaAs/In structure depending on annealing temperature TR A. Baltakesmez et al. · Physica B: Condensed Matter · 2021
- Current-voltage characteristics of p-CuO/n-Si heterojunction for solar cell application TR Reşit Özmenteş · Materials Today: Proceedings · 2021
- DOI 10.1149/2162-8777/ac26d9 2021
- The comparison of Co/hematoxylin/n-Si and Co/hematoxylin/p-Si devices as rectifier for a wide range temperature TR Mehmet Yilmaz et al. · Materials Science in Semiconductor Processing · 2020
- On the studies of capacitance–voltage and impedance spectroscopy of an Ni/(GO-Fe3O4)/n-Si heterojunction device over a wide temperature range TR Ilknur Gumus et al. · Semiconductor Science and Technology · 2020
- Determination of Structural Properties of Some Important Polymers Used as Interfacial Layer in Fabrication of Schottky Barrier Diodes (SBDs) TR Çiğdem BİLKAN · Iğdır Üniversitesi Fen Bilimleri Enstitüsü Dergisi · 2020
- Detailed Consideration of Electrical and Dielectric Properties of Au/Ni/n-Si MS Structure in a Wide Frequency Range TR Yunus Özen · Silicon · 2020
- Au/C20H12/n-Si (MPS) Yapının Elektriksel Özelliklerinin Frekansa Bağlı İncelenmesi TR Seda BENGİ · Iğdır Üniversitesi Fen Bilimleri Enstitüsü Dergisi · 2020 · cites 2 articles of this academic
- Investigation of the electrical properties of diodes by crosschecking dependence on the presence of (nanocarbon-PVP) interface layer TR Çiğdem Bilkan · Journal of Materials Science: Materials in Electronics · 2020
- DOI 10.1088/2053-1591/aba818 2020 · cites 2 articles of this academic
- DOI 10.1016/j.tsf.2020.138229 2020
- Frequency and voltage dependent electrical and dielectric properties of Ag/nGO doped PVA/p-Si sandwich structure at room temperature TR Şükrü Karataş · Journal of Sandwich Structures & Materials · 2019
- The C–V characteristics of the Cu2WSe4/p-Si heterojunction depending on wide range temperature TR Adem Koçyiğit et al. · Journal of Materials Science: Materials in Electronics · 2019
- The Aromatic Thermosetting Copolyester for Schottky Diode Applications in a Wide Temperature Range TR İkram Orak et al. · Journal of Electronic Materials · 2019
- On the profile of temperature dependent main electrical parameters in Al/P3HT/p-Si (MPS) structures at low temperatures TR E. Yükseltürk et al. · Materials Today: Proceedings · 2019
- Schottky diyot tabanlı UV detektörlerde seri direnç etkileri TR Şadan ÖZDEN · Balıkesir Üniversitesi Fen Bilimleri Enstitüsü Dergisi · 2019
- DOI 10.1109/jeds.2019.2900542 2019
- DOI 10.1007/s11182-019-01646-7 2019
- DOI 10.1007/s12043-019-1868-2 2019
Where does this list come from?
Extracted from the reference lists in Crossref’s public March 2026 data file; 20.3% of the file has been processed, so the list may be incomplete. Crossref citations are never added to or compared with the OpenAlex citation counts; the two sources have different coverage.
Field ranking
Position in the main-field, side-field and keyword cohorts by YÖKSİS article score; each card opens that ranking.
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Main field Fen Bilimleri ve Matematik Temel AlanıPoints rank #7,376/ 11,969 top 61.6% At university #44/ 96Score 8.75 journal 8 · OA add 0.75
- Article rank6,211/11,969
- Scopus rank7,540/11,969
- WoS rank8,514/11,969
- YÖKSİS19
- Scopus8
- WoS5
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Side field FizikPoints rank #1,701/ 2,615 top 65.0% At university #9/ 18Score 8.75 journal 8 · OA add 0.75
- Article rank1,377/2,615
- Scopus rank1,736/2,615
- WoS rank1,920/2,615
- YÖKSİS19
- Scopus8
- WoS5
Works 19
YÖKSİS and OpenAlex records: index distribution, journals published in, a filterable article list and the other output types.
Indexes and citation percentiles
?Other counts
Scopus (SJR)
- YÖKSİS rows 8
WoS (JCR)
- YÖKSİS rows 6
Articles
Articles with YÖKSİS and OpenAlex source split; narrow by quartile or TR Index.
Journals with publications
8 journals
Narrow down
Article list
- 2024 Examination of Electrical and Dielectric Parameters of Au/n-Si Schottky Barrier Diodes (SBDs) with Organic Perylene Interlayer Using Impedance Measurements Under Various Illumination Intensities YÖKSİS SJR Q2 JCR Q2 OpenAlex top 10% OpenAlex 94.4%
- 2024 Determining the dielectric characteristics of the Au/C20H12/n-Si (MPS) structure over a wide temperature and voltage YÖKSİS SJR Q3 JCR Q3 OpenAlex 84.4%
- 2023 Analysis of Series Resistance's (RS) Impact on Ag/Perylene/n-Si Schottky Barrier Diode (SBD) in Various Techniques YÖKSİS TR Index OpenAlex 53.4%
- 2019 The Investigation of Frequency and Voltage Dependence of Electrical Characteristics in Al/P3HT/p-Si (MPS) Structures YÖKSİS SJR Q2 OpenAlex 49.6%
- 2019 On the profile of temperature dependent main electrical parameters in Al/P3HT/p-Si (MPS) structures at low temperatures YÖKSİS SJR Q2 OpenAlex 49.6%
- 2017 Temperature dependence of characteristic parameters of the Au/C20H12/n-Si Schottky barrier diodes (SBDs) in the wide temperature range YÖKSİS SJR Q2 JCR Q2 OpenAlex top 10% OpenAlex 92.3%
- 2016 The Effects Illumination Electrical Parameters on Au P3HT n Si Schottky Barrier Diode YÖKSİS OpenAlex 2.7%
- 2015 The Effect of Interface States and Series Resistance on Current Voltage Characteristics in MIS Schottky Diodes YÖKSİS OpenAlex 59.6%
- 2015 A compare of electrical characteristics in Al p Si MS and Al C20H12 p Si MPS type diodes using current voltage I V and capacitance voltage C V measurements YÖKSİS
- 2014 Electrical and dielectric properties of Al p Si and Al perylene p Si type diodes in a wide frequency range YÖKSİS SJR Q2 JCR Q2 OpenAlex 87.1%
- 2013 The C V and G V Electrical Characteristics of 60Co ray IrradiatedAl Si3N4 p Si MIS Structures YÖKSİS
- 2013 The effect of series resistance and interface states on the frequency dependent C V and G w V characteristics of Al perylene p Si MPS type Schottky barrier diodes YÖKSİS
- 2008 ANALYSIS OF FORMATION OF SILICON NITRIDE ON Si 100 BY ELECTROCHEMICAL ANODIZATION TECHNIQUE YÖKSİS
- 2008 The double Gaussian distribution of inhomogeneous barrier heights in Al GaN p GaAs MIS Schottky diodes in wide temperature range YÖKSİS
- 2006 Frequency dependent capacitance and conductance voltage characteristics of Al Si3N4 p Si 100 MIS diodes YÖKSİS
- 2006 On the profile of temperature dependent series resistance in Al Si3N4 p Si MIS Schottky diodes YÖKSİS SJR Q1 JCR Q1 OpenAlex top 10% OpenAlex 91.6%
- 2006 Current transport mechanism in Al Si3N4 p Si MIS Schottky barrier diodes at low temperatures YÖKSİS
- 2000 Accumulated Processes in Kinetic of Mechanical and Electrical destruction of polymers YÖKSİS
- 2000 Durable Properties and Structure of Composition of Polypropylene Polyethylene Obtained by Different Ways YÖKSİS
Projects 1
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2008 Kimyasal Püskürtme Tekniği (Chemical Spray Pyrolysis;CSP) ile Yarıiletken İnce Film Üretilmesi
Proceedings 21 See all (21) →
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2017 On the profile of temperature dependent main electrical parameters in Al/P3HT/p-Si (MPS) structures at low temperatures
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2017 The Investigation of Frequency and Voltage Dependence of Electrical Characteristics in Al/P3HT/p-Si (MPS) Structures
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— Al/P3HT/p-Si (MPS) Schottky Diyotlarının Oda Sıcaklığında Akım-Gerilim Karakteristiklerinin I-V, Norde ve Cheung Metodu Kullanılarak İncelenmesi
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— Al/P3HT/p-Si (MPS) Schottky Diyotların Akım-Gerilim Karakteristiklerinin Düşük Sıcaklık Aralığında İncelenmesi
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2022 Analysis of the Electrical Characteristics of Al/ GaN/ p-GaAs Structure at High Temperatures
Collaboration network
From the author lists of YÖKSİS publication records. Duplicate records of a work count once; institutions are co-authors’ current YÖKSİS affiliations.
- Co-authors
- 22
- With an akaturk profile
- 5
- Turkish institutions
- 4
- Co-authored works
- %95
Academic co-authors 5
- ESRA YÜKSELTÜRK Doçent · Ostim Teknik Üniversitesi 4
- SEDA BENGİ Doçent · Başkent Üniversitesi 3
- HURİYE SENEM AYDOĞU Profesör · Kütahya Dumlupınar Üniversitesi same university 2
- SAİT EREN SAN Profesör · Kocaeli Üniversitesi 2
- ÇİĞDEM BİLKAN Profesör · Tokat Gaziosmanpaşa Üniversitesi 1
National collaboration 4 institutions
Within own university2 joint works · Kütahya Dumlupınar Üniversitesi
- Ostim Teknik Üniversitesi 4 works · 1 academics
- Başkent Üniversitesi 3 works · 1 academics
- Kocaeli Üniversitesi 2 works · 1 academics
- Tokat Gaziosmanpaşa Üniversitesi 1 works · 1 academics
Other co-authors (incl. international) 17
ŞEMSETTİN ALTINDAL 12MEHMET MAHİR BÜLBÜL 11HAYRETTİN YÜZER 4E HALİLOVA 2HASAN MEMMEDOV 2M ZEYNALOVA 2MEVLANA CELALETTİN BAYKUL 2S A ABBASOV 2T M VELİYEV 2İ ASKEROV 2AHMET KAYABİRDOĞAN SELÇUKERKAN ACAROĞLUH.G. ÇetinkayaK MORAKİMERVE ÇOTUKTURAN ALPER
Authors without an akaturk profile (international researchers, retired or former academics, students, clinicians) are grouped by name spelling; short forms such as “Gulluce M.” join the single full name they match.