Radiation Effects in Electronics

The Cyber-Physical System (CPS) is a term describing a broad range of complex, multi-disciplinary, physically-aware next generation engineered system that integrates embedded computing technologies (cyber part) into the physical world.In order to define and understand CPS more precisely, this article presents a detail…

• VOLKAN GÜNEŞ

On emerging multicore systems, task replication is a powerful way to achieve high reliability targets. In this paper, we consider the problem of achieving a given reliability target for a set of periodic real-time tasks running on a multicore system with minimum energy consumption. Our framework explicitly takes into…

DRAM is the primary technology used for main memory in modern systems. Unfortunately, as DRAM scales down to smaller technology nodes, it faces key challenges in both data integrity and latency, which strongly affects overall system reliability and performance. To develop reliable and high-performance DRAM-based main…

This paper presents a new algorithm, essential fault reduction, for generating compact test sets for combinational circuits under the single stuck-at fault model, and a new heuristic for estimating the minimum single stuck-at fault test set size. These algorithms together with the dynamic compaction algorithm are inco…

• İLKER HAMZAOĞLU

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The dynamic voltage and frequency scaling (DVFS) technique is the basis of numerous state-of-the-art energy management schemes proposed for real-time embedded systems. However, recent research has illustrated the alarmingly negative impact of DVFS on task and system reliability. In this paper, we consider the problem…

Energy management is important for a spectrum of systems ranging from high-performance architectures to lowend mobile and embedded devices. With the increasing number of transistors, smaller feature sizes, lower supply and threshold voltages, the focus on energy optimization is shifting from dynamic to leakage energy.…

With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energy management technique dynamic voltage and frequency scaling (DVFS) has been shown to have direct and negative effects on reliability. In th…

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• İLKER HAMZAOĞLU

The negative impact of the popular energy management technique Dynamic Voltage and Frequency Scaling (DVFS) on the reliability of real-time embedded systems, in terms of increased transient fault rates, has been recently identified. As a result, recent research literature includes a number of solutions within the so-c…

Transient errors are a major reason for system downtime in many systems. In prior research, the register file has largely been neglected, but since it is accessed very frequently, the probability of transient errors is high. These errors can quickly spread to different parts of the system, and cause an application cra…

To understand and improve DRAM performance, reliability, security, and energy efficiency, prior works study characteristics of commodity DRAM chips. Unfortunately, state-of-the-art open source infrastructures capable of conducting such studies are obsolete, poorly supported, or difficult to use, or their inflexibility…